Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage. Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-7, IEEE Computer Society, 2012. [doi]
Abstract is missing.