ADC linearity test signal generation algorithm

Satoshi Uemori, Takahiro J. Yamaguchi, Satoshi Ito, Yohei Tan, Haruo Kobayashi, Nobukazu Takai, Kiichi Niitsu, Nobuyoshi Ishikawa. ADC linearity test signal generation algorithm. In 2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2010, Kuala Lumpur, Malaysia, December 6-9, 2010. pages 44-47, IEEE, 2010. [doi]

Abstract

Abstract is missing.