Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae. Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-8, IEEE, 2023. [doi]
Abstract is missing.