Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology - researchr publication authors

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Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida. Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 7, IEEE, 2022. [doi]

This author has not been identified. Look up 'Taiki Uemura' in GoogleThis author has not been identified. Look up 'Byungjin Chung' in GoogleThis author has not been identified. Look up 'Jegon Kim' in GoogleThis author has not been identified. Look up 'Hyewon Shim' in GoogleThis author has not been identified. Look up 'Shin-Young Chung' in GoogleThis author has not been identified. Look up 'Brandon Lee' in GoogleThis author has not been identified. Look up 'Jaehee Choi' in GoogleThis author has not been identified. Look up 'Shota Ohnishi' in GoogleThis author has not been identified. Look up 'Ken Machida' in Google

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