Investigation of multi cell upset in sequential logic and validity of redundancy technique - researchr publication authors

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Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka. Investigation of multi cell upset in sequential logic and validity of redundancy technique. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 7-12, IEEE, 2011. [doi]

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