Taiki Uemura, Takashi Kato, Hideya Matsuyama, Keiji Takahisa, Mitsuhiro Fukuda, Kichiji Hatanaka. Investigation of multi cell upset in sequential logic and validity of redundancy technique. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 7-12, IEEE, 2011. [doi]
@inproceedings{UemuraKMTFH11,
title = {Investigation of multi cell upset in sequential logic and validity of redundancy technique},
author = {Taiki Uemura and Takashi Kato and Hideya Matsuyama and Keiji Takahisa and Mitsuhiro Fukuda and Kichiji Hatanaka},
year = {2011},
doi = {10.1109/IOLTS.2011.5993803},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993803},
tags = {redundancy, logic},
researchr = {https://researchr.org/publication/UemuraKMTFH11},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece},
publisher = {IEEE},
isbn = {978-1-4577-1053-7},
}