Automatic generation of formally-proven tamper-resistant Galois-field multipliers based on generalized masking scheme

Rei Ueno, Naofumi Homma, Sumio Morioka, Takafumi Aoki. Automatic generation of formally-proven tamper-resistant Galois-field multipliers based on generalized masking scheme. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 978-983, IEEE, 2017. [doi]

Authors

Rei Ueno

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Naofumi Homma

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Sumio Morioka

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Takafumi Aoki

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