Rei Ueno, Naofumi Homma, Sumio Morioka, Takafumi Aoki. Automatic generation of formally-proven tamper-resistant Galois-field multipliers based on generalized masking scheme. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 978-983, IEEE, 2017. [doi]
@inproceedings{UenoHMA17,
title = {Automatic generation of formally-proven tamper-resistant Galois-field multipliers based on generalized masking scheme},
author = {Rei Ueno and Naofumi Homma and Sumio Morioka and Takafumi Aoki},
year = {2017},
doi = {10.23919/DATE.2017.7927133},
url = {https://doi.org/10.23919/DATE.2017.7927133},
researchr = {https://researchr.org/publication/UenoHMA17},
cites = {0},
citedby = {0},
pages = {978-983},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}