Scan based process parameter estimation through path-delay inequalities - researchr publication authors

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Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato. Scan based process parameter estimation through path-delay inequalities. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 3553-3556, IEEE, 2010. [doi]

This author has not been identified. Look up 'Takumi Uezono' in GoogleThis author has not been identified. Look up 'Tomoyuki Takahashi' in GoogleThis author has not been identified. Look up 'Michihiro Shintani' in GoogleThis author has not been identified. Look up 'Kazumi Hatayama' in GoogleThis author has not been identified. Look up 'Kazuya Masu' in GoogleThis author has not been identified. Look up 'Hiroyuki Ochi' in GoogleThis author has not been identified. Look up 'Takashi Sato' in Google

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