Takumi Uezono, Tomoyuki Takahashi, Michihiro Shintani, Kazumi Hatayama, Kazuya Masu, Hiroyuki Ochi, Takashi Sato. Scan based process parameter estimation through path-delay inequalities. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 3553-3556, IEEE, 2010. [doi]
@inproceedings{UezonoTSHMOS10, title = {Scan based process parameter estimation through path-delay inequalities}, author = {Takumi Uezono and Tomoyuki Takahashi and Michihiro Shintani and Kazumi Hatayama and Kazuya Masu and Hiroyuki Ochi and Takashi Sato}, year = {2010}, doi = {10.1109/ISCAS.2010.5537813}, url = {http://dx.doi.org/10.1109/ISCAS.2010.5537813}, tags = {rule-based}, researchr = {https://researchr.org/publication/UezonoTSHMOS10}, cites = {0}, citedby = {0}, pages = {3553-3556}, booktitle = {International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France}, publisher = {IEEE}, }