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Fault tolerance via analytic redundancy for a modularized sensitive skin

D. Um, Vladimir J. Lumelsky. Fault tolerance via analytic redundancy for a modularized sensitive skin. In Proceedings 1999 IEEE/RSJ International Conference on Intelligent Robots and Systems. Human and Environment Friendly Robots with High Intelligence and Emotional Quotients, October 17-21,1999, Hyundai Hotel, Kyongju, Korea. pages 1191-1197, IEEE, 1999. [doi]

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D. Um

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Vladimir J. Lumelsky

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