D. Um, Vladimir J. Lumelsky. Fault tolerance via analytic redundancy for a modularized sensitive skin. In Proceedings 1999 IEEE/RSJ International Conference on Intelligent Robots and Systems. Human and Environment Friendly Robots with High Intelligence and Emotional Quotients, October 17-21,1999, Hyundai Hotel, Kyongju, Korea. pages 1191-1197, IEEE, 1999. [doi]
@inproceedings{UmL99-0,
title = {Fault tolerance via analytic redundancy for a modularized sensitive skin},
author = {D. Um and Vladimir J. Lumelsky},
year = {1999},
doi = {10.1109/IROS.1999.812841},
url = {http://dx.doi.org/10.1109/IROS.1999.812841},
researchr = {https://researchr.org/publication/UmL99-0},
cites = {0},
citedby = {0},
pages = {1191-1197},
booktitle = {Proceedings 1999 IEEE/RSJ International Conference on Intelligent Robots and Systems. Human and Environment Friendly Robots with High Intelligence and Emotional Quotients, October 17-21,1999, Hyundai Hotel, Kyongju, Korea},
publisher = {IEEE},
isbn = {0-7803-5184-3},
}