Soyeon Um, Jaehyuk Lee, Hoi-Jun Yoo. A 3.8 mW 1.9 m Ω/√Hz Electrical Impedance Tomography Imaging with 28.4 M Ω High Input Impedance and Loading Calibration. In 49th IEEE European Solid State Circuits Conference, ESSCIRC 2023, Lisbon, Portugal, September 11-14, 2023. pages 357-360, IEEE, 2023. [doi]
Abstract is missing.