On thresholds for robust goodness-of-fit tests - researchr publication authors

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Jayakrishnan Unnikrishnan, Sean P. Meyn, Venugopal V. Veeravalli. On thresholds for robust goodness-of-fit tests. In Marcus Greferath, Joachim Rosenthal, Alexander Barg, Gilles Zémor, editors, 2010 IEEE Information Theory Workshop, ITW 2010, Dublin, Ireland, August 30 - September 3, 2010. pages 1-4, IEEE, 2010. [doi]

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