On thresholds for robust goodness-of-fit tests

Jayakrishnan Unnikrishnan, Sean P. Meyn, Venugopal V. Veeravalli. On thresholds for robust goodness-of-fit tests. In Marcus Greferath, Joachim Rosenthal, Alexander Barg, Gilles ZĂ©mor, editors, 2010 IEEE Information Theory Workshop, ITW 2010, Dublin, Ireland, August 30 - September 3, 2010. pages 1-4, IEEE, 2010. [doi]

Abstract

Abstract is missing.