Jayakrishnan Unnikrishnan, Sean P. Meyn, Venugopal V. Veeravalli. On thresholds for robust goodness-of-fit tests. In Marcus Greferath, Joachim Rosenthal, Alexander Barg, Gilles Zémor, editors, 2010 IEEE Information Theory Workshop, ITW 2010, Dublin, Ireland, August 30 - September 3, 2010. pages 1-4, IEEE, 2010. [doi]
@inproceedings{UnnikrishnanMV10,
title = {On thresholds for robust goodness-of-fit tests},
author = {Jayakrishnan Unnikrishnan and Sean P. Meyn and Venugopal V. Veeravalli},
year = {2010},
doi = {10.1109/CIG.2010.5592803},
url = {https://doi.org/10.1109/CIG.2010.5592803},
researchr = {https://researchr.org/publication/UnnikrishnanMV10},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2010 IEEE Information Theory Workshop, ITW 2010, Dublin, Ireland, August 30 - September 3, 2010},
editor = {Marcus Greferath and Joachim Rosenthal and Alexander Barg and Gilles Zémor},
publisher = {IEEE},
isbn = {978-1-4244-8264-1},
}