Tag testing methodology for RFID enabled temperature tracking and shelf life estimation - researchr publication authors

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Ismail Uysal, Jean-Pierre Emond, Gisele Bennett. Tag testing methodology for RFID enabled temperature tracking and shelf life estimation. In 2011 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2011, Sitges, Spain, September 15-16, 2011. pages 8-15, IEEE, 2011. [doi]

This author has not been identified. Look up 'Ismail Uysal' in GoogleThis author has not been identified. Look up 'Jean-Pierre Emond' in GoogleThis author has not been identified. Look up 'Gisele Bennett' in Google

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