Ismail Uysal, Jean-Pierre Emond, Gisele Bennett. Tag testing methodology for RFID enabled temperature tracking and shelf life estimation. In 2011 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2011, Sitges, Spain, September 15-16, 2011. pages 8-15, IEEE, 2011. [doi]
@inproceedings{UysalEB11,
title = {Tag testing methodology for RFID enabled temperature tracking and shelf life estimation},
author = {Ismail Uysal and Jean-Pierre Emond and Gisele Bennett},
year = {2011},
doi = {10.1109/RFID-TA.2011.6068608},
url = {http://dx.doi.org/10.1109/RFID-TA.2011.6068608},
researchr = {https://researchr.org/publication/UysalEB11},
cites = {0},
citedby = {0},
pages = {8-15},
booktitle = {2011 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2011, Sitges, Spain, September 15-16, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0028-6},
}