Mohammad M. Uzzal, Payman Zarkesh-Ha, Paul Szauter, Jeremy S. Edwards. Analytical noise model for avalanche ISFET sensor suitable for Next Generation Sequencing. In Karan S. Bhatia, Massimo Alioto, Danella Zhao, Andrew Marshall, Ramalingam Sridhar, editors, 29th IEEE International System-on-Chip Conference, SOCC 2016, Seattle, WA, USA, September 6-9, 2016. pages 189-193, IEEE, 2016. [doi]
Abstract is missing.