Anis Uzzaman, Bibo Li, Thomas J. Snethen, Brion L. Keller, Gary Grise. Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]
Abstract is missing.