Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera. Test Roles in Diagnosis and Silicon Debug. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 367, IEEE, 2007. [doi]
Abstract is missing.