A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect - researchr publication authors

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Javier Vales-Alonso, Juan Pedro Muñoz-Gea, Juan J. Alcaraz. A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect. In 2015 International EURASIP Workshop on RFID Technology, EURFID 2015, Rosenheim, Germany, October 22-23, 2015. pages 48-52, IEEE, 2015. [doi]

This author has not been identified. Look up 'Javier Vales-Alonso' in GoogleThis author has not been identified. Look up 'Juan Pedro Muñoz-Gea' in GoogleThis author has not been identified. Look up 'Juan J. Alcaraz' in Google

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