A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect

Javier Vales-Alonso, Juan Pedro Muñoz-Gea, Juan J. Alcaraz. A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect. In 2015 International EURASIP Workshop on RFID Technology, EURFID 2015, Rosenheim, Germany, October 22-23, 2015. pages 48-52, IEEE, 2015. [doi]

Abstract

Abstract is missing.