Javier Vales-Alonso, Juan Pedro Muñoz-Gea, Juan J. Alcaraz. A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect. In 2015 International EURASIP Workshop on RFID Technology, EURFID 2015, Rosenheim, Germany, October 22-23, 2015. pages 48-52, IEEE, 2015. [doi]
@inproceedings{Vales-AlonsoMA15,
title = {A bivariate DTMC model of the RFID FSA reading process to study the continuous wave outage effect},
author = {Javier Vales-Alonso and Juan Pedro Muñoz-Gea and Juan J. Alcaraz},
year = {2015},
doi = {10.1109/EURFID.2015.7332384},
url = {http://dx.doi.org/10.1109/EURFID.2015.7332384},
researchr = {https://researchr.org/publication/Vales-AlonsoMA15},
cites = {0},
citedby = {0},
pages = {48-52},
booktitle = {2015 International EURASIP Workshop on RFID Technology, EURFID 2015, Rosenheim, Germany, October 22-23, 2015},
publisher = {IEEE},
isbn = {978-3-2000-3735-9},
}