Alessandro Vallero, Alessandro Savino, Alberto Carelli, Stefano Di Carlo. Bayesian models for early cross-layer reliability analysis and design space exploration. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 143-146, IEEE, 2019. [doi]
@inproceedings{ValleroSCC19,
title = {Bayesian models for early cross-layer reliability analysis and design space exploration},
author = {Alessandro Vallero and Alessandro Savino and Alberto Carelli and Stefano Di Carlo},
year = {2019},
doi = {10.1109/IOLTS.2019.8854452},
url = {https://doi.org/10.1109/IOLTS.2019.8854452},
researchr = {https://researchr.org/publication/ValleroSCC19},
cites = {0},
citedby = {0},
pages = {143-146},
booktitle = {25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019},
editor = {Dimitris Gizopoulos and Dan Alexandrescu and Panagiota Papavramidou and Michail Maniatakos},
publisher = {IEEE},
isbn = {978-1-7281-2490-2},
}