Alessandro Vallero, Sotiris Tselonis, Dimitris Gizopoulos, Stefano Di Carlo. Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.