An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics - researchr publication

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David P. Vallett. An Overview of CMOS VLSI Failure Analysis and the Importance of Test and Diagnostics. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 930, IEEE Computer Society, 1996.

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