Nonparametric item analysis and confirmatory factorial validity of the computer attitude scale for secondary students

Pierre Valois, Éric Frenette, Paul Y. Villeneuve, Stéphane Sabourin, Christiane Bordeleau. Nonparametric item analysis and confirmatory factorial validity of the computer attitude scale for secondary students. Computers & Education, 35(4):281-294, 2000. [doi]

Abstract

Abstract is missing.