Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Erik Bury, Adrian Chasin, Jacopo Franco, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken. Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 6, IEEE, 2022. [doi]
Abstract is missing.