Loïc Vandeventer, Jean François Santucci. Speeding up test pattern generation from behavioral VHDL descriptions containing several processes. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 632-637, IEEE Computer Society, 1994. [doi]
@inproceedings{VandeventerS94:0,
title = {Speeding up test pattern generation from behavioral VHDL descriptions containing several processes},
author = {Loïc Vandeventer and Jean François Santucci},
year = {1994},
doi = {10.1145/198174.198343},
url = {http://doi.acm.org/10.1145/198174.198343},
tags = {testing},
researchr = {https://researchr.org/publication/VandeventerS94%3A0},
cites = {0},
citedby = {0},
pages = {632-637},
booktitle = {Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994},
editor = {Jean Mermet},
publisher = {IEEE Computer Society},
isbn = {0-89791-685-9},
}