Speeding up test pattern generation from behavioral VHDL descriptions containing several processes

Loïc Vandeventer, Jean François Santucci. Speeding up test pattern generation from behavioral VHDL descriptions containing several processes. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 632-637, IEEE Computer Society, 1994. [doi]

Abstract

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