Loïc Vandeventer, Jean François Santucci. Algorithms for behavioral test pattern generation from VHDL circuit descriptions containing loop language constructs. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 638-643, IEEE Computer Society, 1994. [doi]
@inproceedings{VandeventerS94a, title = {Algorithms for behavioral test pattern generation from VHDL circuit descriptions containing loop language constructs}, author = {Loïc Vandeventer and Jean François Santucci}, year = {1994}, doi = {10.1145/198174.198344}, url = {http://doi.acm.org/10.1145/198174.198344}, tags = {pattern language, testing}, researchr = {https://researchr.org/publication/VandeventerS94a}, cites = {0}, citedby = {0}, pages = {638-643}, booktitle = {Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994}, editor = {Jean Mermet}, publisher = {IEEE Computer Society}, isbn = {0-89791-685-9}, }