Algorithms for behavioral test pattern generation from VHDL circuit descriptions containing loop language constructs

Loïc Vandeventer, Jean François Santucci. Algorithms for behavioral test pattern generation from VHDL circuit descriptions containing loop language constructs. In Jean Mermet, editor, Proceedings EURO-DAC 94, European Design Automation Conference, Grenoble, France, September 19-22, 1994. pages 638-643, IEEE Computer Society, 1994. [doi]

Abstract

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