On-Chip Aging Sensor Core for Silicon Lifecycle Management

Fabian Vargas 0001, Aneesh Balakrishnan. On-Chip Aging Sensor Core for Silicon Lifecycle Management. In 26th IEEE Latin American Test Symposium, LATS 2025, San Andres Islas, Colombia, March 11-14, 2025. pages 1-6, IEEE, 2025. [doi]

Abstract

Abstract is missing.