Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems

Fabian Vargas, E. Bezerra, L. Wulff, Daniel Barros Jr.. Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 52-57, IEEE Computer Society, 1998. [doi]

Authors

Fabian Vargas

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E. Bezerra

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L. Wulff

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Daniel Barros Jr.

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