Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems

Fabian Vargas, E. Bezerra, L. Wulff, Daniel Barros Jr.. Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 52-57, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.