Harsha B. Variar, Satendra Kumar Gautam, Ashita Kumar, K. M. Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava. Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]
@inproceedings{VariarGKALSMMS23,
title = {Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept},
author = {Harsha B. Variar and Satendra Kumar Gautam and Ashita Kumar and K. M. Amogh and Juan Luo and Ning Shi and David Marreiro and Shekar Mallikarjunaswamy and Mayank Shrivastava},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118220},
url = {https://doi.org/10.1109/IRPS48203.2023.10118220},
researchr = {https://researchr.org/publication/VariarGKALSMMS23},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}