Harsha B. Variar, Satendra Kumar Gautam, Ashita Kumar, K. M. Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava. Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.