Pramodchandran N. Variyam. Increasing the IDDQ test resolution using current prediction. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 217-224, IEEE Computer Society, 2000.
@inproceedings{Variyam00, title = {Increasing the IDDQ test resolution using current prediction}, author = {Pramodchandran N. Variyam}, year = {2000}, tags = {testing}, researchr = {https://researchr.org/publication/Variyam00}, cites = {0}, citedby = {0}, pages = {217-224}, booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, publisher = {IEEE Computer Society}, }