Pramodchandran N. Variyam - researchr alias

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Viewing Publication 1 - 19 from 19

2010

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication DevicesGanesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam. et, 26(4):405-417, 2010. [doi]

2006

DIBPro: Automatic Diagnostic Program Generation ToolVenkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal. itc 2006: 1-8 [doi]

2005

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testersGanesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee. ets 2005: 68-73 [doi]

2004

Partial Bi-Immunity and NP-CompletenessJohn M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam. eccc, (025), 2004. [doi]

2003

Automatic Diagnostic Program Generation for Mixed Signal Load BoardKranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam. itc 2003: 403-409 [doi]

2002

Measuring Stray Capacitance on Tester HardwareAchintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley. vts 2002: 351-356 [doi]

Prediction of analog performance parameters using fast transienttestingPramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee. tcad, 21(3):349-361, 2002. [doi]

2000

Measuring code edges of ADCs using interpolation and its application to offset and gain error testingPramodchandran N. Variyam, Vinay Agrawal. itc 2000: 349-357

Increasing the IDDQ test resolution using current predictionPramodchandran N. Variyam. itc 2000: 217-224

Specification-driven test generation for analog circuitsPramodchandran N. Variyam, Abhijit Chatterjee. tcad, 19(10):1189-1201, 2000. [doi]

Digital-Compatible BIST for Analog Circuits Using Transient Response SamplingPramodchandran N. Variyam, Abhijit Chatterjee. dt, 17(3):106-115, 2000. [doi]

1999

Test Generation for Analog Circuits Using Partial Numerical SimulationPramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee. vlsid 1999: 597-602 [doi]

Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical SimulationPramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee. vts 1999: 214-219 [doi]

1998

Specification-Driven Test Design for Analog CircuitsPramodchandran N. Variyam, Abhijit Chatterjee. dft 1998: 335-340 [doi]

Enhancing Test Effectiveness for Analog Circuits Using Synthesized MeasurementsPramodchandran N. Variyam, Abhijit Chatterjee. vts 1998: 132-137 [doi]

Hierarchical Statistical Inference Model for Specification Based Testing of Analog CircuitsHeebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi. vts 1998: 145-151 [doi]

1997

Test generation for comprehensive testing of linear analog circuits using transient response samplingPramodchandran N. Variyam, Abhijit Chatterjee. iccad 1997: 382-385 [doi]

Low-cost and efficient digital-compatible BIST for analog circuits using pulse response samplingPramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi. vts 1997: 261-266 [doi]

FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State RepresentationPramodchandran N. Variyam, Abhijit Chatterjee. vlsid 1997: 408-412 [doi]

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