Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley. Measuring Stray Capacitance on Tester Hardware. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 351-356, IEEE Computer Society, 2002. [doi]
Abstract is missing.