Measuring Stray Capacitance on Tester Hardware - researchr publication authors

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Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley. Measuring Stray Capacitance on Tester Hardware. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 351-356, IEEE Computer Society, 2002. [doi]

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