Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley. Measuring Stray Capacitance on Tester Hardware. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 351-356, IEEE Computer Society, 2002. [doi]
@inproceedings{HalderCVR02,
title = {Measuring Stray Capacitance on Tester Hardware},
author = {Achintya Halder and Abhijit Chatterjee and Pramodchandran N. Variyam and John Ridley},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/vts/2002/1570/00/15700351abs.htm},
researchr = {https://researchr.org/publication/HalderCVR02},
cites = {0},
citedby = {0},
pages = {351-356},
booktitle = {20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1570-3},
}