Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling

Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi. Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 261-266, IEEE Computer Society, 1997. [doi]

Authors

Pramodchandran N. Variyam

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Abhijit Chatterjee

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Naveena Nagi

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