Linearity testing of ADCs using low linearity stimulus and Kalman filtering

Bharath K. Vasan, Randall L. Geiger, Degang Chen. Linearity testing of ADCs using low linearity stimulus and Kalman filtering. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 3032-3035, IEEE, 2010. [doi]

Authors

Bharath K. Vasan

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Randall L. Geiger

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Degang Chen

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