Linearity testing of ADCs using low linearity stimulus and Kalman filtering - researchr publication related

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Bharath K. Vasan, Randall L. Geiger, Degang Chen. Linearity testing of ADCs using low linearity stimulus and Kalman filtering. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 3032-3035, IEEE, 2010. [doi]

The following publications are possibly variants of this publication:

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus SignalLe Jin, Degang Chen, Randall L. Geiger. vts 2007: 303-310 [doi]

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Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus SignalLe Jin, Degang Chen, Randall L. Geiger. tim, 58(8):2679-2685, 2009. [doi]

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