An Operationally Efficient Scheme for Exhaustive Test-Pattern Generation Using Linear Codes

Nagesh Vasanthavada, Peter N. Marinos. An Operationally Efficient Scheme for Exhaustive Test-Pattern Generation Using Linear Codes. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 476-482, IEEE Computer Society, 1985.

Abstract

Abstract is missing.