A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test

Rajath Vasudevamurthy, Pratap Kumar Das, Bharadwaj Amrutur. A mostly-digital analog scan-out chain for low bandwidth voltage measurement for analog IP test. In International Symposium on Circuits and Systems (ISCAS 2011), May 15-19 2011, Rio de Janeiro, Brazil. pages 2035-2038, IEEE, 2011. [doi]

Abstract

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