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STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations

Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras. STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations. In 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015. pages 1-6, IEEE, 2015. [doi]

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Elena I. Vatajelu

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Rosa Rodríguez-Montañés

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Marco Indaco

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Paolo Prinetto

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Joan Figueras

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