Elena I. Vatajelu, Rosa Rodríguez-Montañés, Marco Indaco, Paolo Prinetto, Joan Figueras. STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations. In 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{VatajeluRIPF15,
title = {STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations},
author = {Elena I. Vatajelu and Rosa Rodríguez-Montañés and Marco Indaco and Paolo Prinetto and Joan Figueras},
year = {2015},
doi = {10.1109/DTIS.2015.7127377},
url = {http://dx.doi.org/10.1109/DTIS.2015.7127377},
researchr = {https://researchr.org/publication/VatajeluRIPF15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2015, Napoli, Italy, April 21-23, 2015},
publisher = {IEEE},
isbn = {978-1-4799-1999-4},
}